표 1. | Table 1. 시험 설계 방법 | Test design method

Method	Metric to demonstrate	Can solve for
Parametric Binominal	Reliability or Mean time to failure(MTTF)	Test time or Sample size
Non-Parametric Binominal	Reliability	Reliability or Confidence level or Sample size
Exponential Chi-Squared	Reliability or Mean time to failure(MTTF)	Test time
Non-Parametric Bayesian	Reliability	Reliability or Confidence level or Sample size